Reference number: BWT-TSF
Translucent Sampling Fixtures for path-length adjustment
Need more info?
Contact our expert.
Martin
Labus
Sales Engineer
+49 8153 405-17
m.labus@laser2000.de
Need more info?
Contact our expert.
Eugenie
Strasser
Sales Engineer
+49 8153 405-53
e.strasser@laser20000.de
Description
The TSF adjustable sampling fixture allows you to adjust the path-length by manually adjusting the mounted collimating lens on one side of the sample, and/or the integrating sphere on the other side. This allows you to measure translucence using large and/or awkwardly shaped samples.
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