Line Laser Profiling System

Line Laser Profiling System
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  • Line Laser Profiling System
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Reference number: DAT-LLPS-xxx

The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 μm in width.

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Karl
Cichon

Sales Engineer

+49 8153 405-50

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Sven
Gruca

Sale Engineer

+49 8153 405-51

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Martin
Labus

Sales Engineer

+49 8153 405-17

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Eugenie
Strasser

Sales Engineer

+49 8153 405-53

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Description

The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 μm in width. By scanning DataRay’s flagship WinCamD-LCM4 beam profiling camera across the length of the beam using our 200 mm linear stage, the full-featured free software will display a full image of the line laser intensity distribution along with a vertical centroid plot, line width plot, and several other useful measurements.

The line laser profiling system is supported by DataRay’s full-featured, highly customizable, user-centric software which has no license fees, unlimited installations, and free software updates. The software controls the movement of the stage, automatically configures the optimal exposure time for the line laser scan, and provides an analysis of the line.


Software:

  • Automatic exposure configuration
  • Custom Start/End locations
  • Automatic PDF report generation
  • Residual sensor tilt compensation
  • Export data to Excel or CSV
  • Save/Load line laser files (*.l_wcf)

System (LLPS-50, LLPS-200):

  • Line laser length/width measurements
  • Absolute vertical centroids
  • Deviation of vertical centroids from a linear regression line
  • Line tilt measured in degrees
  • 50mm or 200 mm Translation Stage
  • 190 to 1150 nm, CMOS detector
    • 4.2 MPixel, 2048 x 2048 pixels 
    • 11.3 x 11.3 mm active area
    • 5.5 μm pixel size
  • HyperCal™ – Dynamic Noise and Baseline Correction software
  • 2,500:1 Signal to RMS Noise
  • 12-bit ADC
  • Window-free sensors standard to prevent fringing
  • Global shutter allowing for pulsed or CW measurements