This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
Measurement Technology
Fluoresence microscopy
Fluoresence microscopy
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Measurement Technology
Measurement technology with lasers is extremely precise and already in frequent use. Since there is no contact with the measuring object when a laser is used, soft, sticky, hot, or otherwise sensitive surfaces can be measured. There is no wear on the sensor during the process. The first step for creating perfect interior design is precise surveying. Laser measuring devices simplify workflows, enable precise transmission of process values, and increase productivity through enormous time and cost savings. Laser 2000 offers high-precision, compact, and robust laser measuring devices.
By means of the described UV converter optics the measurement of the intensity distribution of UV laser radiation with standard Si-based CCD or CMOS cameras is possible.
IR converter optics for Beam Profiler for measuring intensity distribution in the NIR range between 1480 and 1600 nm.
The scanning system BeamR with rotating slots for the measurement of lasers with diameters of 0.5 microns to about 3 mm.
This optical beam reducer to be connected to the C-mount a camera WinCamD-ray analysis is used when the beam diameter of the laser is much greater than the sensor chip or of the taper.
The THz-Camera is a flexible Terahertz imaging solution for science and industry.
Based on the patented multi plane scanning technology the scanning system the BeamMap allows the measurement of focal position, beam diameter (according to ISO 11146), divergence and the M2 factor of different focussed cw or qcw laser beams in real time.
A main feature of the WinCamD is the optional M2 Stage. Thus, it can be easily extended to a complete M2 measurement system.
Laser beam profiler with fiber optic taper for characterizing large laser beams up to 25 mm x 25 mm.
The beam analysis camera WinCamD-IR-BB with integrated microbolometer array enables analyzes on long-wave lasers in the range of 2 μm to 16 μm.
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 μm in width.
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In cooperation with our partner Xenlux, Laser 2000 offers support and consultancy for new and continuing development of custom specific fiber optic components and subsystems. With many years of experience, our target-oriented approach and precise monitoring of each phase of the project guarantee timely prototyping and short time to market.
